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Maroc Maroc - TECHXPLORE.COM - RSS news feed - 14/May 20:14

Researchers solve longstanding problem in measuring semiconductor defects

Researchers at Sandia National Laboratories and Auburn University have developed a new method to more accurately detect atomic-scale defects in electronic materials, an advance that could help improve technologies ranging from electric vehicles to high-power electronics. The study, appearing in the Journal of Applied Physics, addresses a longstanding challenge in understanding what happens at the critical boundary where a semiconductor meets an insulating layer.

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